| Grain Growth and the Puzzle of its Stagnation in Thin Films: The Tale of a Tail and an Ear? |
| Professor Katayun
(Katy) Barmak, Carnegie Mellon University A central problem in materials is the tailoring of the grain structure
(or more generally nano/microstructure) to achieve the properties required
for desired performance in engineered systems. Studies of grain
growth in materials date back to the 1920's – therefore, grain
growth, is, in some sense, an old problem that should have been understood
and solved by now. Indeed, the problem is old enough to have rudimentary
explanations provided in undergraduate level materials text books. However,
truly predictive theories of grain growth that incorporate experimentally-determined
grain boundary properties and satisfy the thermodynamic and topological
constraints of the grain boundary network are not yet available – but
they are perhaps a little closer given the recent generalization of the
von Neumann-Mullins "n-6 rule" for growth of grains in two
dimensions to three dimensions by MacPherson and Srolovitz. In this
talk, I will review a decade’s worth of experimental studies in Al
and Cu films carried out in our group. I will compare the experimental
results with those from two-dimensional simulations that do and do not
incorporate drag and pinning mechanisms. My aim is to leave you not only
with an appreciation of how difficult the problem of grain growth is, but
also how very puzzling its stagnation in thin films is. |